In our interconnected world, collaboration is an integral element in achieving shared goals. The U.S. standardization system has the greatest impact when all stakeholders work together — from the public and private sector; to national and international representatives; to consumers, industry, governments, academia, and non-governmental organizations — because all participant voices matter. In light of the benefits that collaboration brings to the standards community, the 2023 U.S. Celebration of World Standards Day will celebrate the theme, “A Shared Vision for a Better World.”

Launched in 1970, the U.S. Celebration of World Standards Day (WSD) is an annual event recognizing the importance of various stakeholder groups across the standards community, including business leaders, industry, academia, and government. U.S. activities are organized annually by a planning committee consisting of representatives from the standards and conformity assessment community, and co-chaired by the American National Standards Institute (ANSI) and the National Institute of Standards and Technology (NIST). This year, WSD will be held on Thursday, October 12, 2023, in Washington, DC. ASTM International will serve as the 2023 administrating organization.

Each year, WSD features a theme relevant to the broader community and its priorities. In 2023, the standards community will reflect on how we can achieve more through collaborative standardization efforts, developing solutions for the complex global challenges surrounding sustainability, safety, security, and climate change. The celebration will highlight how working together can leave a better, more resilient, and more equitable world for the next generation.

The U.S. Celebration of WSD will also include the presentation of the Ronald H. Brown Standards Leadership Award, which honors decorated astronaut Michael López-Alegría, as well as a paper competition for individuals in the U.S. standards community.

Access more information on the U.S. Celebration of World Standards Day webpage.